Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion. - Kosuke Ikeda; Keith Schaub; Ira Leventhal; Yiorgos Makris; Constantinos Xanthopoulos; Deepika Neethirajan (ITC, 2019)

Machine Learning-based Noise Classification and Decomposition in RF Transceivers. - Deepika Neethirajan; Constantinos Xanthopoulos; Kiruba S. Subramani; Keith Schaub; Ira Leventhal; Yiorgos Makris (VTS, 2019)

IP Session on Machine Learning Applications in IC Test-Related Tasks. - Ghada Sokar; Yassin Zakaria; Asmaa Rabie; Kareem Madkour; Ira Leventhal; Jochen Rivoir; Xinli Gu; Haralampos-G. D. Stratigopoulos (VTS, 2019)

Automated Socket Anomaly Detection through Deep Learning. - Nidhi Agrawal; Min-Jian Yang; Constantinos Xanthopoulos; Vijayakumar Thangamariappan; Joe Xiao; Chee-Wah Ho; Keith Schaub; Ira Leventhal (ITC, 2020)

Improvements in Automated IC Socket Pin Defect Detection. - Vijayakumar Thangamariappan; Nidhi Agrawal; Jason Kim 008; Constantinos Xanthopoulos; Ken Butler; Ira Leventhal; Joe Xiao (ITC, 2022)

Innovative Practices Track: Session 6 - Using AI to Address the Silicon Growth Curve. - Duane Brown; Ira Leventhal; Sri Ganta; Keith Schaub (VTS, 2024)