Irena Kazymyra
Orcid: 0000-0003-1597-5647
According to our database1,
Irena Kazymyra
authored at least 2 papers
in 2001.
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Bibliography
2001
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement.
Microelectron. Reliab., 2001
Development of the Special Software Tools for the Defect/Fault Analysis in the Complex Gates from Standard Cell Library.
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001