According to our database1, Irena Kazymyra
Legend:Book In proceedings Article PhD thesis Other
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement.
Microelectronics Reliability, 2001
Development of the Special Software Tools for the Defect/Fault Analysis in the Complex Gates from Standard Cell Library.
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001