Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (DTIS, 2021)

An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. - Isaac Bruce; Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ETS, 2021)

Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ITC, 2021)

Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (DFT, 2022)

Graph Theory Approach for Multi-site ATE Board Parameter Extraction. - Abraham Steenhoek; Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ETS, 2022)

Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ITC, 2022)

The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (VTS, 2022)

A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (J. Electron. Test., 2022)

Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm. - Isaac Bruce; Michael Sekyere; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Kushagra Bhatheja; Degang Chen 001 (MWSCAS, 2023)

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm. - Michael Sekyere; Emmanuel Nti Darko; Isaac Bruce; Ekaniyere Oko-Odion; Kushagra Bhatheja; Degang Chen 001 (MWSCAS, 2023)

A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. - Isaac Bruce; Praise O. Farayola; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (J. Electron. Test., 2023)

A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities. - Isaac Bruce; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Kushagra Bhatheja; Matthew Crabb; Degang Chen 001 (ISVLSI, 2024)

Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm. - Ekaniyere Oko-Odion; Isaac Bruce; Emmanuel Nti Darko; Michael Sekyere; Degang Chen 001 (ISVLSI, 2024)

Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm. - Isaac Bruce; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Matthew Crabb; Degang Chen 001 (MWSCAS, 2024)

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs. - Saeid Karimpour; Isaac Bruce; Michael Sekyere; Ruohan Yang; Emmanuel Nti Darko; Degang Chen 001 (MWSCAS, 2024)

A BIST Approach to Approximate Co-Testing of Embedded Data Converters. - Kushagra Bhatheja; Shravan K. Chaganti; Johnathan Leisinger; Emmanuel Nti Darko; Isaac Bruce; Degang Chen 001 (IEEE Des. Test, 2024)

Efficient Hybrid Resistor-String and Capacitor DAC with Area Efficient Redundancy-Based Digital Calibration for High-Performance Applications. - Ekaniyere Oko-Odion; Emmanuel Nti Darko; Isaac Bruce; Matthew Crabb; Degang Chen 001 (I2MTC, 2025)

A Compact 3-Segment 15-bit Capacitive DAC with Digital Calibration for Improved Linearity. - Emmanuel Nti Darko; Isaac Bruce; Ekaniyere Oko-Odion; Saeid Karimpour; Kushagra Bhatheja; Degang Chen 001 (ISCAS, 2025)

Matching Critical Analog Circuit Components Up To Third-Order Gradients for All Possible Exact Matching Ratios. - Michael Sekyere; Isaac Bruce; Ruohan Yang; Degang Chen 001; Colin C. McAndrew; Xiankun Jin; Chen He; Doug Garrity (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)