New experimental approach for failure prediction in electronics: Topography and deformation measurement complemented with acoustic microscopy. - Isaline Richard; Romain Fayolle; Jean-Claude Lecomte (Microelectron. Reliab., 2005)

Use of golden samples for the assessment of the quality and reproducibility of scanning acoustic microscopy images of electronics samples. - Michael Hertl; Nicolas Vivet; Fabien Allanic; Sandra Dureau; Armelle Minguet; Nicolas Porcher; Isaline Richard; Pauline Serre (Microelectron. Reliab., 2018)