On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation. - Islam A. K. M. Mahfuzul; Hidetoshi Onodera (Asian Test Symposium, 2012)

On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation. - Islam A. K. M. Mahfuzul; Hidetoshi Onodera (IEICE Trans. Inf. Syst., 2013)

A body bias generator with wide supply-range down to threshold voltage for within-die variability compensation. - Norihiro Kamae; Islam A. K. M. Mahfuzul; Akira Tsuchiya; Hidetoshi Onodera (A-SSCC, 2014)

Characterization and compensation of performance variability using on-chip monitors. - Islam A. K. M. Mahfuzul; Hidetoshi Onodera (VLSI-DAT, 2014)

Modeling, Characterization and Compensation of Performance Variability using On-chip Monitor Circuits for Energy-efficient LSI. - Islam A. K. M. Mahfuzul (2014)

Energy reduction by built-in body biasing with single supply voltage operation. - Norihiro Kamae; Islam A. K. M. Mahfuzul; Akira Tsuchiya; Tohru Ishihara; Hidetoshi Onodera (ISQED, 2015)

Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process and Temperature Monitoring. - Islam A. K. M. Mahfuzul; Jun Shiomi; Tohru Ishihara; Hidetoshi Onodera (IEEE J. Solid State Circuits, 2015)

On-chip monitoring and compensation scheme with fine-grain body biasing for robust and energy-efficient operations. - Islam A. K. M. Mahfuzul; Hidetoshi Onodera (ASP-DAC, 2016)

Effect of supply voltage on random telegraph noise of transistors under switching condition. - Islam A. K. M. Mahfuzul; Hidetoshi Onodera (PATMOS, 2017)

Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors. - Islam A. K. M. Mahfuzul; Masamune Hamamatsu; Tomoyuki Yokota; Sunghoon Lee; Wakako Yukita; Makoto Takamiya; Takao Someya; Takayasu Sakurai (IEEE J. Emerg. Sel. Topics Circuits Syst., 2017)

A 13nW temperature-to-digital converter utilizing sub-threshold MOSFET operation at sub-thermal drain voltage. - Teruki Someya; Islam A. K. M. Mahfuzul; Takayasu Sakurai; Makoto Takamiya (CICC, 2018)

PVT2: process, voltage, temperature and time-dependent variability in scaled CMOS process. - A. K. M. Mahfuzul Islam; Hidetoshi Onodera (ICCAD, 2018)

Worst-Case Performance Analysis Under Random Telegraph Noise Induced Threshold Voltage Variability. - A. K. M. Mahfuzul Islam; Hidetoshi Onodera (PATMOS, 2018)

Feature Extraction, Performance Analysis and System Design Using the DU Mobility Dataset. - Swapnil Sayan Saha; Shafizur Rahman; Miftahul Jannat Rasna; Tarek Bin Zahid; A. K. M. Mahfuzul Islam; Md. Atiqur Rahman Ahad (IEEE Access, 2018)

CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring. - Koutaro Miyazaki; Yang Lo; A. K. M. Mahfuzul Islam; Katsuhiro Hata; Makoto Takamiya; Takayasu Sakurai (ICICDT, 2019)

Analysis of Random Telegraph Noise (RTN) at Near-Threshold Operation by Measuring 154k Ring Oscillators. - A. K. M. Mahfuzul Islam; Ryota Shimizu; Hidetoshi Onodera (IRPS, 2019)

Drive-Strength Selection for Synthesis of Leakage-Dominant Circuits. - A. K. M. Mahfuzul Islam; Shinichi Nishizawa; Yusuke Matsui; Yoshinobu Ichida (ISQED, 2019)

Circuit Techniques for Device-Circuit Interaction toward Minimum Energy Operation. - A. K. M. Mahfuzul Islam; Hidetoshi Onodera (IPSJ Trans. Syst. LSI Des. Methodol., 2019)

An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage. - Teruki Someya; A. K. M. Mahfuzul Islam; Takayasu Sakurai; Makoto Takamiya (IEEE J. Solid State Circuits, 2019)

A process scalable voltage-reference-free temperature sensor utilizing MOSFET threshold voltage variation. - Shogo Harada; Mahfuzul Islam 001; Takashi Hisakado; Osami Wada (A-SSCC, 2021)

CDF Distance Based Statistical Parameter Extraction Using Nonlinear Delay Variation Models. - Kensuke Murakami; Mahfuzul Islam 001; Hidetoshi Onodera (IOLTS, 2021)

Flash ADC Utilizing Offset Voltage Variation With Order Statistics Based Comparator Selection. - Takehiro Kitamura; Mahfuzul Islam 001; Takashi Hisakado; Osami Wada (ISQED, 2021)

Performance Improvement of Order Statistics Based Flash ADC Using Multiple Comparator Groups. - Takehiro Kitamura; Mahfuzul Islam 001; Takashi Hisakado; Osami Wada (NEWCAS, 2022)

Low-Power Design of Digital LDO With Nonlinear Symmetric Frequency Generation. - Shun Yamaguchi; Mahfuzul Islam 001; Takashi Hisakado; Osami Wada (IEEE Trans. Circuits Syst. II Express Briefs, 2022)

Order Statistics Based Low-Power Flash ADC with On-Chip Comparator Selection. - Takehiro Kitamura; Mahfuzul Islam 001; Takashi Hisakado; Osami Wada (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2022)

Demonstration of Order Statistics Based Flash ADC in a 65nm Process. - Mahfuzul Islam 001; Takehiro Kitamura; Takashi Hisakado; Osami Wada (ASP-DAC, 2023)

A Fully Synchronous Digital LDO with Built-in Adaptive Frequency Modulation and Implicit Dead-Zone Control. - Shun Yamaguchi; Mahfuzul Islam 001; Takashi Hisakado; Osami Wada (ASP-DAC, 2023)

An Adaptive-Sampling Digital LDO with Statistical Comparator Selection Achieving 99.99% Maximum Current Efficiency and 0.25ps FoM in 65nm. - Shun Yamaguchi; Takashi Hisakado; Osami Wada; Mahfuzul Islam 001 (A-SSCC, 2023)

CMOS Temperature Sensor Utilizing Gate-length-based Threshold Voltage Modulation. - Mahfuzul Islam 001; Shogo Harada; Takashi Hisakado; Osami Wada (NEWCAS, 2023)

Design of Reference-free Flash ADC With On-chip Rank-based Comparator Selection Using Multiple Comparator Groups. - Takehiro Kitamura; Takashi Hisakado; Osami Wada; Mahfuzul Islam 001 (IPSJ Trans. Syst. LSI Des. Methodol., 2024)

Self-recovery hysteresis control based on-chip SC DC-DC converter robust to load fluctuation. - Koji Kikuta; Takashi Hisakado; Mahfuzul Islam 001 (ASP-DAC, 2025)