Quality Performance Modeling in a Deteriorating Production System with Partially Available Inspection. - Israel Tirkel; Gad Rabinowitz (OR, 2010)

Optimized inspection capacity for out of control detection in semiconductor manufacturing. - Israel Tirkel (WSC, 2012)

A queuing network model for wafer fabrication using decomposition without aggregation. - Dean Grosbard; Adar Kalir; Israel Tirkel; Gad Rabinowitz (CASE, 2013)

The effectiveness of variability reduction in decreasing wafer fabrication cycle time. - Israel Tirkel (WSC, 2013)

Throughput and flow-time in a production line with partial machine availability and imperfect quality processing. - Maayan Eyal; Israel Tirkel (WSC, 2015)

Scheduling preventive maintenance within a queue time for maximum throughput in semiconductor manufacturing. - Adar A. Kalir; Israel Tirkel (WSC, 2016)

The efficiency of inspection based on out of control detection in wafer fabrication. - Israel Tirkel (Comput. Ind. Eng., 2016)

Approximating class-departure variability in tandem queues with downtime events: Regression-based variability function. - Ruth Sagron; Gad Rabinowitz; Israel Tirkel (Comput. Oper. Res., 2017)

New LST of inter-departure times in PH/G/1 queue, and extensions to ME/G/1 and G/G/1 queues. - Ruth Sagron; Yoav Kerner; Gad Rabinowitz; Israel Tirkel (Comput. Ind. Eng., 2019)