Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. - Egas Henes Neto; Ivandro Ribeiro; Michele G. Vieira; Gilson I. Wirth; Fernanda Lima Kastensmidt (SBCCI, 2005)

Single event transients in dynamic logic. - Gilson I. Wirth; Ivandro Ribeiro; Michele G. Vieira; Fernanda Gusmão de Lima Kastensmidt (SBCCI, 2006)

Using Bulk Built-in Current Sensors to Detect Soft Errors. - Egas Henes Neto; Ivandro Ribeiro; Michele G. Vieira; Gilson I. Wirth; Fernanda Lima Kastensmidt (IEEE Micro, 2006)