An analysis of scale-space sampling in SIFT. - Ives Rey-Otero; Jean-Michel Morel; Mauricio Delbracio (ICIP, 2014)

Comparing Feature Detectors: A bias in the repeatability criteria, and how to correct it. - Ives Rey-Otero; Mauricio Delbracio; Jean-Michel Morel (CoRR, 2014)

Anatomy of the SIFT Method. - Ives Rey-Otero; Mauricio Delbracio (Image Process. Line, 2014)

Comparing feature detectors: A bias in the repeatability criteria. - Ives Rey-Otero; Mauricio Delbracio; Jean-Michel Morel (ICIP, 2015)

Is Repeatability an Unbiased Criterion for Ranking Feature Detectors? - Ives Rey-Otero; Mauricio Delbracio (SIAM J. Imaging Sci., 2015)

Analysis dictionary learning for scene classification. - Wen Tang; Ives Rey-Otero; Hamid Krim; Liyi Dai (SSP, 2016)

Computing an Exact Gaussian Scale-Space. - Ives Rey-Otero; Mauricio Delbracio (Image Process. Line, 2016)

An Analysis of the Factors Affecting Keypoint Stability in Scale-Space. - Ives Rey-Otero; Jean-Michel Morel; Mauricio Delbracio (J. Math. Imaging Vis., 2016)

Variations on the Convolutional Sparse Coding Model. - Ives Rey-Otero; Jeremias Sulam; Michael Elad (IEEE Trans. Signal Process., 2020)