Test Sequencing in Complex Manufacturing Systems. - R. Boumen; Ivo S. M. de Jong; J. W. H. Vermunt; Joanna M. van de Mortel-Fronczak; Jacobus E. Rooda (IEEE Trans. Syst. Man Cybern. Part A, 2008)

Risk-Based Stopping Criteria for Test Sequencing. - R. Boumen; Ivo S. M. de Jong; J. W. H. Vermunt; Joanna M. van de Mortel-Fronczak; Jacobus E. Rooda (IEEE Trans. Syst. Man Cybern. Part A, 2008)

Integration and Test Sequencing for Complex Systems. - R. Boumen; Ivo S. M. de Jong; J. M. G. Mestrom; Joanna M. van de Mortel-Fronczak; Jacobus E. Rooda (IEEE Trans. Syst. Man Cybern. Part A, 2009)

Hierarchical Test Sequencing for Complex Systems. - R. Boumen; Sui Ruan; Ivo S. M. de Jong; Joanna M. van de Mortel-Fronczak; Jacobus E. Rooda; Krishna R. Pattipati (IEEE Trans. Syst. Man Cybern. Part A, 2009)

Process Mining Applied to the Test Process of Wafer Scanners in ASML. - Anne Rozinat; Ivo S. M. de Jong; Christian W. Günther; Wil M. P. van der Aalst (IEEE Trans. Syst. Man Cybern. Part C, 2009)