Optical interaction in active analog circuit elements. - Ivo Vogt; Tomonori Nakamura; Christian Boit (Microelectron. Reliab., 2017)

Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra. - Ivo Vogt; Tomonori Nakamura; B. Motamedi; Christian Boit (Microelectron. Reliab., 2018)

Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera. - Ivo Vogt; Tomonori Nakamura; Ingrid De Wolf; Christian Boit (Microelectron. Reliab., 2018)