External memory BIST for system-in-package. - Kaname Yamasaki; Iwao Suzuki; Azumi Kobayashi; Keiichi Horie; Yasuharu Kobayashi; Hideyuki Aoki; Hideki Hayashi; Kenichi Tada; Koki Tsutsumida; Keiichi Higeta (ITC, 2005)

Hardware Overhead Reduction for Memory BIST. - Masayuki Arai; Kazuhiko Iwasaki; Michinobu Nakao; Iwao Suzuki (ITC, 2008)

Reduction of Area per Good Die for SoC Memory Built-In Self-Test. - Masayuki Arai; Tatsuro Endo; Kazuhiko Iwasaki; Michinobu Nakao; Iwao Suzuki (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010)

Voltammetric Response of Alizarin Red S-Confined Film-Coated Electrodes to Diol and Polyol Compounds: Use of Phenylboronic Acid-Modified Poly(ethyleneimine) as Film Component. - Shigehiro Takahashi; Iwao Suzuki; Takuto Ojima; Daichi Minaki; Jun-ichi Anzai (Sensors, 2018)