An Approach to Improve the Resolution of Defect-Based Diagnosis. - Iwao Yamazaki; Hiroki Yamanaka; Toshio Ikeda; Masahiro Takakura; Yasuo Sato (Asian Test Symposium, 2001)

An evaluation of defect-oriented test: WELL-controlled low voltage test. - Yasuo Sato; Masaki Kohno; Toshio Ikeda; Iwao Yamazaki; Masato Hamamoto (ITC, 2001)

A Persistent Diagnostic Technique for Unstable Defects. - Yasuo Sato; Iwao Yamazaki; Hiroki Yamanaka; Toshio Ikeda; Masahiro Takakura (ITC, 2002)

Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration. - Yasuo Sato; Iwao Yamazaki; Hiroki Yamanaka; Toshio Ikeda; Masahiro Takakura; Kazuhiko Iwasaki (IEICE Trans. Inf. Syst., 2004)

Sparc64 VIIIfx: A New-Generation Octocore Processor for Petascale Computing. - Takumi Maruyama; Toshio Yoshida; Ryuji Kan; Iwao Yamazaki; Shuji Yamamura; Noriyuki Takahashi; Mikio Hondou; Hiroshi Okano (IEEE Micro, 2010)