A One-Bit-Signature BIST for Embedded Operational Amplifiers in Mixed-Signal Circuits Based on the Slew-Rate Detection. - Iyad Rayane; Jaime Velasco-Medina; Michael Nicolaidis (DATE, 1999)

Automatic Design of Optimal Concurrent Fault Detector for Linear Analog Systems. - Emmanuel Simeu; Arno W. Peters; Iyad Rayane (FTCS, 1999)

On-Line BIST for Testing Analog Circuits. - Jaime Velasco-Medina; Iyad Rayane; Michael Nicolaidis (ICCD, 1999)

A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits. - Iyad Rayane; Jaime Velasco-Medina; Michael Nicolaidis (VTS, 1999)

A comprehensive study of monolithic 3D cell on cell design using commercial 2D tool. - Olivier Billoint; Hossam Sarhan; Iyad Rayane; Maud Vinet; Perrine Batude; Claire Fenouillet-Béranger; Olivier Rozeau; Gerald Cibrario; Fabien Deprat; A. Fustier; Julien Michallet; Olivier Faynot; et al. (DATE, 2015)

From 2D to Monolithic 3D: Design Possibilities, Expectations and Challenges. - Olivier Billoint; Hossam Sarhan; Iyad Rayane; Maud Vinet; Perrine Batude; Claire Fenouillet-Béranger; Olivier Rozeau; Gerald Cibrario; Fabien Deprat; Ogun Turkyilmaz; Sébastien Thuries; Fabien Clermidy (ISPD, 2015)