Non-Gaussian Statistical Timing models of die-to-die and within-die parameter variations for full chip analysis. - Katsumi Homma; Izumi Nitta; Toshiyuki Shibuya (ASP-DAC, 2008)

"Condition-based" dummy fill insertion method based on ECP and CMP predictive models. - Izumi Nitta; Yuji Kanazawa; Daisuke Fukuda; Toshiyuki Shibuya; Naoki Idani; Masaru Ito; Osamu Yamasaki; Norihiro Harada; Takanori Hiramoto (ISQED, 2010)

Speed-path analysis for multi-path failed latches with random variation. - Tsutomu Ishida; Izumi Nitta; Katsumi Homma; Yuzi Kanazawa; Hiroaki Komatsu (ISQED, 2012)

A volume diagnosis method for identifying systematic faults in lower-yield wafer occurring during mass production. - Tsutomu Ishida; Izumi Nitta; Koji Banno; Yuzi Kanazawa (ASP-DAC, 2014)

Deep Learning-Based Wafer-Map Failure Pattern Recognition Framework. - Tsutomu Ishida; Izumi Nitta; Daisuke Fukuda; Yuzi Kanazawa (ISQED, 2019)

Graph-based Massive Open Online Course (MOOC) Dropout Prediction using Clickstream Data in Virtual Learning Environment. - Izumi Nitta; Ryo Ishizaki; Masafumi Shingu; Satoshi Nakashima; Koji Maruhashi; Arseny Tolmachev; Masaru Todoriki (ICCSE, 2021)

AI Ethics Impact Assessment based on Requirement Engineering. - Izumi Nitta; Kyoko Ohashi; Satoko Shiga; Sachiko Onodera (RE Workshops, 2022)