Dynamic anti-WindUp for MIMO systems. - J. A. Rodriguez; José A. Romagnoli; Graham C. Goodwin (ECC, 1999)

High-temperature and high-field cycling reliability of PZT films embedded within 130 nm CMOS. - Grant Walters; Paul Chojecki; Alexandra Garraud; Toshikazu Nishida; Scott R. Summerfelt; J. A. Rodriguez; A. G. Acosta (IRPS, 2018)