Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS. - Rosa Rodríguez-Montañés; Jaume A. Segura 001; Víctor H. Champac; Joan Figueras; J. A. Rubio (ITC, 1991)

Quiescent current analysis and experimentation of defective CMOS circuits. - Jaume A. Segura 001; Víctor H. Champac; Rosa Rodríguez-Montañés; Joan Figueras; J. A. Rubio (J. Electron. Test., 1992)

Quixote: Supporting Group Decisions Through the Web. - J. A. Rubio; David Ríos Insua; Jesus Rios; Eugenio Fernández (TCGOV, 2005)