Characterization of semiconductor interfaces using a modified mixed mode bending apparatus. - J. Thijsse; Olaf van der Sluis; J. A. W. van Dommelen; Willem D. van Driel; Marc G. D. Geers (Microelectron. Reliab., 2008)

Influence of particle shape in the additive manufacturing process for ceramics. - Steyn Westbeek; J. A. W. van Dommelen; Joris Remmers; Marc G. D. Geers (Comput. Math. Appl., 2019)