A Novel Lumped Two Degrees Of Freedom Pull-In Approach To Electrostatic Torsional Micromirrors. - J.-M. Huang; A. Q. Liu; X. M. Zhang; J. Ahn (Int. J. Comput. Eng. Sci., 2003)

Design of field-plate terminated 4H-SiC Schottky diodes using high-k dielectrics. - Amit Kumta; Rusli; Chin-Che Tin; J. Ahn (Microelectron. Reliab., 2006)

Scaling of Memory Performance and Capacity with CXL Memory Expander. - Sung Joo Park; H. Kim; K.-S. Kim; J. So; J. Ahn; W.-J. Lee; D. Kim; Young-Ju Kim 003; J. Seok; J.-G. Lee; H.-Y. Ryu; C. Y. Lee; et al. (HCS, 2022)

Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology. - Sunhang Lee; Nam-Hyun Lee; G.-J. Kim; J. Ahn; Ik-Hwan Kim; S. Ha; S. Rhee; GH Bae; KW Lee; YS Lee; SB. Ko; S. Pae (IRPS, 2024)

Novel Linear Model for OFF-State Stress Causing Stand-By Current of Advanced VNAND Chip. - H. Park; G.-J. Kim; N.-J. Kim; J. Ahn; T. You; Y. Kang; M. Yoon; S. Lee; N.-H. Lee; S. Hwang; YC Hwang; SB. Ko; et al. (IRPS, 2025)