Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. - Felix Beaudoin; D. Carisetti; Romain Desplats; Philippe Perdu; Dean Lewis; J. C. Clement (Microelectron. Reliab., 2002)

Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC. - Mohsine Bouya; D. Carisetti; Nathalie Malbert; Nathalie Labat; Philippe Perdu; J. C. Clement; M. Bonnet; G. Pataut (Microelectron. Reliab., 2007)

Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques. - Mohsine Bouya; Nathalie Malbert; Nathalie Labat; D. Carisetti; Philippe Perdu; J. C. Clement; Benoit Lambert; M. Bonnet (Microelectron. Reliab., 2008)

Failure analysis of GaAs microwave devices with plastic encapsulation by electro-optical techniques. - W. Ben Naceur; Nathalie Malbert; Nathalie Labat; Hélène Frémont; D. Carisetti; J. C. Clement; J. L. Muraro; Barbara Bonnet (Microelectron. Reliab., 2013)