Single contact optical beam induced currents. - J. M. Chin; J. C. H. Phang; D. S. H. Chan; M. Palaniappan; G. Gilfeather; C. E. Soh (Microelectron. Reliab., 2001)

Analysis of high-power devices using proton beam induced charge microscopy. - M. Zmeck; J. C. H. Phang; Andrew Bettiol; T. Osipowicz; F. Watt; L. J. Balk; Franz-Josef Niedernostheide; Hans-Joachim Schulze; E. Falck; R. Barthelmess (Microelectron. Reliab., 2001)

Single contact beam induced current phenomenon for microelectronic failure analysis. - J. C. H. Phang; D. S. H. Chan; V. K. S. Ong; S. Kolachina; J. M. Chin; M. Palaniappan; G. Gilfeather; Y. X. Seah (Microelectron. Reliab., 2003)

Near-field detection of photon emission from silicon with 30 nm spatial resolution. - D. Isakov; A. A. B. Tio; T. Geinzer; J. C. H. Phang; Y. Zhang; L. J. Balk (Microelectron. Reliab., 2008)

Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations. - A.-K. Tiedemann; K. Kurz; M. Fakhri; Ralf Heiderhoff; J. C. H. Phang; L. J. Balk (Microelectron. Reliab., 2009)