Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique. - Dionyz Pogany; Ján Kuzmík; J. Darmo; Martin Litzenberger; Sergey Bychikhin; Karl Unterrainer; Z. Mozolova; S. Hascik; Tibor Lalinsky; Erich Gornik (Microelectron. Reliab., 2002)