Automatic evaluation of segregation streaks in material samples. - Ching-Chung Li; J. F. Mancuso; Yung-Nien Sun (Pattern Recognit. Lett., 1984)

A preliminary study of automated inspection of VLSI resist patterns. - Ching-Chung Li; J. F. Mancuso; David B. Shu; Yung-Nien Sun; L. D. Roth (ICRA, 1985)

A Line Extraction Method for Automated SEM Inspection of VLSI Resist. - David B. Shu; Ching-Chung Li; J. F. Mancuso; Yung-Nien Sun (IEEE Trans. Pattern Anal. Mach. Intell., 1988)