A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis. - Jon C. Lee; David Su; J. H. Chuang (Microelectron. Reliab., 2001)

Investigation of Sensitivity Improvement on Passive Voltage Contrast for Defect Isolation. - Jon C. Lee; C. H. Chen; David Su; J. H. Chuang (Microelectron. Reliab., 2002)

A Novel Application of C-AFM: Deep Sub-micron Single Probing for IC Failure Analysis. - Jon C. Lee; J. H. Chuang (Microelectron. Reliab., 2003)