Electromigration Reliability of VLSI Interconnect. - J. Joseph Clement; Eugenia M. Atakov; James R. Lloyd (Digit. Tech. J., 1992)

Methodology for electromigration critical threshold design rule evaluation. - J. Joseph Clement; Stefan P. Riege; Radenko Cvijetic; Carl V. Thompson (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

Electromigration Reliability Issues in High-Performance Circuit Design (Tutorial Abstract). - J. Joseph Clement (ISQED, 2002)