Transient effects on high voltage diode stack under reverse bias. - Václav Papez; B. Kojecký; J. Kozísek; J. Hejhal (Microelectron. Reliab., 2003)

Monitoring of carrier lifetime distribution in high power semiconductor device technology. - J. Kozísek; Z. Machacek; Vitezslav Benda (Microelectron. J., 2008)