High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. - J. Kuchenbecker; Mattia Borgarino; M. Zeuner; U. König; Robert Plana; Fausto Fantini (Microelectron. Reliab., 2003)

The advent of MEMS in space. - Xavier Lafontan; Francis Pressecq; Felix Beaudoin; Sebastien Rigo; M. Dardalhon; J.-L. Roux; Petra Schmitt; J. Kuchenbecker; B. Baradat; Djemel Lellouchi (Microelectron. Reliab., 2003)