Fault Detection By Consumption Measurement in CMOS Circuits. - Mireille Jacomino; J. L. Rainard; René David (Fehlertolerierende Rechensysteme, 1987)

Some relationships between delay testing and stuck-open testing in CMOS circuits. - Rene David; S. Rahal; J. L. Rainard (EURO-DAC, 1990)

Hierarchical Test Analysis of VLSI Circuits for Random BIST. - G. Masseboeuf; J. Pulou; J. L. Rainard (EDCC, 1994)