Strain effect on mobility in nanowire MOSFETs down to 10nm width: Geometrical effects and piezoresistive model. - J. Pelloux-Prayer; Mikaël Cassé; François Triozon; Sylvain Barraud; Yann-Michel Niquet; J.-L. Rouviere; Olivier Faynot; Gilles Reimbold (ESSDERC, 2015)