New qualification approach for optoelectronic components. - Jean-Luc Goudard; P. Berthier; X. Boddaert; Dominique Laffitte; J. Périnet (Microelectron. Reliab., 2002)

New method of qualification applied to optical amplifier with electronics. - C. Gautier; J. Périnet; E. Nissou; Dominique Laffitte (Microelectron. Reliab., 2003)

Reliability of optoelectronics components: towards new qualification practices. - Jean-Luc Goudard; X. Boddaert; J. Périnet; Dominique Laffitte (Microelectron. Reliab., 2003)

Defect signatures in degraded high power laser diodes. - Vanesa Hortelano; Julian Anaya; Jorge Souto; Juan Jiménez; J. Périnet; François J. Laruelle (Microelectron. Reliab., 2013)