Improvement of reliability for high-ohmic Cr-Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water. - X. Y. Wang; Q. Cheng; X. P. Ma; H. Zhang; M. X. Li; T. N. Chen; P. Zhang; J. Q. Shao (Microelectron. Reliab., 2016)

Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment. - X. Y. Wang; H. Zhang; X. P. Ma; Q. Cheng; C. G. Li; M. X. Li; T. N. Chen; P. Zhang; J. Q. Shao (Microelectron. Reliab., 2016)