Estimation of area and performance overheads for testable VLSI circuits. - J. R. Miles; Anthony P. Ambler; K. A. E. Totton (ICCD, 1988)

Cost Analysis of Test Method Environments. - Chryssa Dislis; I. D. Dear; J. R. Miles; S. C. Lau; Anthony P. Ambler (ITC, 1989)