Gate stress effect on low temperature data retention characteristics of split-gate flash memories. - Ling-Chang Hu; An-Chi Kang; Eric Chen; J. R. Shih; Yao-Feng Lin; Kenneth Wu; Ya-Chin King (Microelectron. Reliab., 2005)

New TDDB lifetime model for AC inverter-like stress in advance FinFET structure. - I. K. Chen; C. L. Chen; Y.-H. Lee; R. Lu; Y. W. Lee; H. H. Hsu; Y. W. Tseng; Y. W. Lin; J. R. Shih (IRPS, 2015)