Characterization of an SRAM based particle detector for mixed-field radiation environments. - Georgios Tsiligiannis; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Serge Pravossoudovitch; Aida Todri-Sanial; Arnaud Virazel; Julien Mekki; Markus Brugger; J.-R. Vaillé; Frederic Wrobel; Frédéric Saigné (IWASI, 2013)

Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model. - K. Guetarni; Antoine D. Touboul; Jerome Boch; L. Foro; A. Privat; Alain Michez; J.-R. Vaillé; Frédéric Saigné (Microelectron. Reliab., 2013)

Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET. - Alain Michez; Jerome Boch; S. Dhombres; Frédéric Saigné; Antoine D. Touboul; J.-R. Vaillé; Laurent Dusseau; E. Lorfèvre; R. Ecoffet (Microelectron. Reliab., 2013)

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. - Vincent Pouget; S. Jonathas; R. Job; J.-R. Vaillé; Frederic Wrobel; Frédéric Saigné (Microelectron. Reliab., 2017)