Retrieval of atmospheric water vapor profiles using radiometric measurements at 183 and 90 GHz. - Robert Lutz; Thomas T. Wilheit; J. R. Wang; R. K. Kakar (IEEE Trans. Geosci. Remote. Sens., 1991)

Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal Integrity Pattern Recognition for Wafer Test. - Nadun Sinhabahu; Katherine Shu-Min Li; Jian-De Li; J. R. Wang; Sying-Jyan Wang (ITC, 2022)

Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing. - Nadun Sinhabahu; Katherine Shu-Min Li; Sying-Jyan Wang; J. R. Wang; Matt Ho (ITC, 2023)