Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. - Brahim Benbakhti; J. S. Ayubi-Moak; Karol Kalna; D. Lin; Geert Hellings; Guy Brammertz; Kristin De Meyer; Iain Thayne; Asen Asenov (Microelectron. Reliab., 2010)