Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current. - X. Perpiñà; Jean-François Serviere; J. Saiz; Davide Barlini; Michel Mermet-Guyennet; José Millán (Microelectron. Reliab., 2006)

Virtual reliability assessment of integrated power switches based on multi-domain simulation approach. - Pierre Solomalala; J. Saiz; Michel Mermet-Guyennet; Alberto Castellazzi; Mauro Ciappa; X. Chauffleur; Jean-Pierre Fradin (Microelectron. Reliab., 2007)