Transient-induced latch-up test setup for wafer-level and package-level. - Detlef Bonfert; Horst A. Gieser; Heinrich Wolf; M. Frank; A. Konrad; J. Schulz (Microelectron. Reliab., 2006)

Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. - Michael Heer; Viktor Dubec; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; M. Frank; A. Konrad; J. Schulz (Microelectron. Reliab., 2006)

First results of the earth observation Water Cycle Multi-mission Observation Strategy (WACMOS). - Bob Z. Su; D. Fernández-Prieto; Joris Timmermans; Xuelong Chen; Katja Hungershoefer; Rob Roebeling; M. Schröder; J. Schulz; Piet Stammes; P. Wang; Erwin Wolters (Int. J. Appl. Earth Obs. Geoinformation, 2014)

Corrigendum to "First results of the earth observation Water Cycle Multi-mission Observation Strategy (WACMOS)" [Int. J. Applied Earth Observation and Geoinformation 26 (February) (2014) 270-285]. - Bob Z. Su; D. Fernández-Prieto; Joris Timmermans; Xuelong Chen; Katja Hungershoefer; Rob Roebeling; M. Schröder; J. Schulz; Piet Stammes; P. Wang; Erwin Wolters (Int. J. Appl. Earth Obs. Geoinformation, 2014)

Prospective slice-by-slice motion correction reduces false positive activations in fMRI with task-correlated motion. - J. Schulz; T. Siegert; Pierre-Louis Bazin; Julian R. Maclaren; Michael Herbst; Maxim Zaitsev; Robert Turner (NeuroImage, 2014)