A Novel Method for the Determination of Electromigration-Induced Void Nucleation Stresses. - J. Shuster-Passage; S. Abdel Razek; M. Mattoo; Meike Hauschildt; Seungman Choi; Martin Gall; Armen Kteyan; Jun-Ho Choy; Valeriy Sukharev; Matthias Kraatz; J. R. Lloyd (IRPS, 2024)

A Unified Physics-Based Stochastic Model for EM-Induced Resistance Degradation in BEoL Interconnect Segments. - Valeriy Sukharev; Jun-Ho Choy; Armen Kteyan; J. Shuster-Passage; Seungman Choi; Martin Gall (IRPS, 2024)