Passive integration and RF MEMS: a toolkit for adaptive LC circuits. - Theo G. S. M. Rijks; Joost T. M. van Beek; M. J. E. Ulenaers; Jeroen De Coster; Robert Puers; Arnold J. den Dekker; L. van Teeffelen (ESSCIRC, 2003)

Temperature stability of a piezoresistive MEMS resonator including self-heating. - S. Bendida; J. J. Koning; J. J. M. Bontemps; J. T. M. van Beek; D. Wu; Marcel A. J. van Gils; S. Nath (Microelectron. Reliab., 2008)

Failure analysis of a thin-film nitride MEMS package. - Q. Li; J. F. L. Goosen; J. T. M. van Beek; Fred van Keulen; K. L. Phan; G. Q. Zhang (Microelectron. Reliab., 2008)

Packaging influences on the reliability of MEMS resonators. - Jeroen J. M. Zaal; W. D. van Driel; S. Bendida; Q. Li; J. T. M. van Beek; G. Q. Zhang (Microelectron. Reliab., 2008)