Supervised and unsupervised learning for characterising the industrial material defects. - P. Radha; N. Selvakumar; J. Raja Sekar; J. V. Johnsonselva (Int. J. Bus. Intell. Data Min., 2022)

Density-Based Dynamically Self-Parameterized Clustering for Material Inspection. - P. Radha; N. Selvakumar; J. Raja Sekar; J. V. Johnsonselva (Comput. J., 2023)