DC Testing of Analog Integrated Circuits with Piecewise Linear Approximation and Interval Analysis. - Domine Leenaerts; J. van Spaandonk (ISCAS, 1993)

Iterative test-point selection for analog circuits. - J. van Spaandonk; Tom A. M. Kevenaar (VTS, 1996)

Selecting measurements to test the functional behavior of analog circuits. - J. van Spaandonk; Tom A. M. Kevenaar (J. Electron. Test., 1996)