Copper trace fatigue models for mechanical cycling, vibration and shock/drop of high-density PWAs. - D. Farley; Y. Zhou; F. Askari; M. Al-Bassyiouni; A. Dasgupta; J. F. J. Caers; J. W. C. DeVries (Microelectron. Reliab., 2010)

An adaptive Cu trace fatigue model based on average cross-section strain. - D. Farley; Yi Zhou 014; A. Dasgupta; J. W. C. DeVries (Microelectron. Reliab., 2012)

Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability. - Michal Jablonski; Riccardo Lucchini; Frederick Bossuyt; Thomas Vervust; Jan Vanfleteren; J. W. C. DeVries; Pasquale Vena; Mario Gonzalez (Microelectron. Reliab., 2015)