Ronald J. W. T. Tangelder

According to our database, Ronald J. W. T. Tangelder authored at least 10 papers between 1996 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures.

V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff

J. Electron. Test., 2002

2001

Modeling a Verification Test System for Mixed-Signal Circuits.

David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff

IEEE Des. Test Comput., 2001

2000

The Test-Cycle Minimization in Parameterized Bus-Oriented Datapath Designs.

V. A. Zivkovic, Ronald J. W. T. Tangelder, H. G. Herkhoff

Proceedings of the 1st Latin American Test Workshop, 2000

Design and Test Space Exploration of Transport-Triggered Architectures.

V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff

Proceedings of the 2000 Design, 2000

1999

Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters.

Richard Rosing, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Manoj Sachdev

J. Electron. Test., 1999

Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.

Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff

J. Electron. Test., 1999

Integrated Design and Test of Mixed-Signal Circuits.

Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek

J. Electron. Test., 1999

Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier.

R. H. Beurze, Y. Xing, R. van Kleef, Ronald J. W. T. Tangelder, Nur Engin

Proceedings of the 4th European Test Workshop, 1999

1997

Smart sensor system application: an integrated compass.

Ronald J. W. T. Tangelder, G. Diemel, Hans G. Kerkhoff

Proceedings of the European Design and Test Conference, 1997

1996

MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation.

Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek, Nur Engin

Proceedings of Third International Conference on Electronics, Circuits, and Systems, 1996