Reliability for Recessed Channel Structure n-MOSFET. - J. Y. Seo; K. J. Lee; Y. S. Kim; S. Y. Lee; S. J. Hwang; C. K. Yoon (Microelectron. Reliab., 2005)

Dielectric reliability of stacked Al2O3-HfO2 MIS capacitors with cylinder type for improving DRAM data retention characteristics. - J. Y. Seo; K. J. Lee; S. Y. Lee; S. J. Hwang; C. K. Yoon (Microelectron. Reliab., 2005)

PMOSFET anti-fuse using GIDL-induced-HEIP mechanism. - J. Y. Seo; J. E. Seok; W. S. Kim; N. H. Cha; J. S. Kang; B. S. So (Microelectron. Reliab., 2010)