Evaluation of conductive-to-resistive layers interaction in thick-film resistors. - Krzysztof Mleczko; Zbigniew Zawislak; Adam Witold Stadler; Andrzej Kolek; Andrzej Dziedzic; Jacek Cichosz (Microelectron. Reliab., 2008)

A New Method for RTS Noise of Semiconductor Devices Identification. - Alicja Konczakowska; Jacek Cichosz; Arkadiusz Szewczyk (IEEE Trans. Instrum. Meas., 2008)

Fuzzy Rule-Based System for the Diagnosis of Laryngeal Pathology Based on Contact Endoscopy Images. - Wojciech Tarnawski; Jacek Cichosz (Information Technologies in Biomedicine, 2008)