Numerical modeling of advanced semiconductor devices. - Wai Lee; Steven E. Laux; Massimo V. Fischetti; Giorgio Baccarani; Antonio Gnudi; Johannes M. C. (Hans) Stork; Jack A. Mandelman; Emmanuel F. Crabbé; Matthew R. Wordeman; Farouk Odeh (IBM J. Res. Dev., 1992)

Challenges and future directions for the scaling of dynamic random-access memory (DRAM). - Jack A. Mandelman; Robert H. Dennard; Gary B. Bronner; John K. DeBrosse; Rama Divakaruni; Yujun Li; Carl J. Raden (IBM J. Res. Dev., 2002)