A time dependent hydrodynamic device simulator SNU-2D with new discretization scheme and algorithm. - Woo-Sung Choi 002; Jae-Gyung Ahn; Young-June Park; Hong-Shick Min; Chang-Gyu Hwang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

Product-level reliability estimator with budget-based reliability management in 20nm technology. - Jae-Gyung Ahn; Ming Feng Lu; Nitin Navale; Dawn Graves; Ping-Chin Yeh; Jonathan Chang; S. Y. Pai (IRPS, 2015)

Electromigration failure rate of redundant via. - Jae-Gyung Ahn; Ping-Chin Yeh; Jonathan Chang (IRPS, 2018)

Design-For-Reliability Flow in 7nm Products with Data Center and Automotive Applications. - Jae-Gyung Ahn; I-Ru Chen; Ping-Chin Yeh; Jonathan Chang (IRPS, 2019)

Estimation of Product Reliability using TDDB Simulation and Statistical EM Method. - Jae-Gyung Ahn; Ping-Chin Yeh; Jonathan Chang (IRPS, 2020)

CCECE 2021 Invited Paper: Holistic Performance, Reliability and Thermal Understanding of HPC Real Utilization on Silicon Architecture. - Gamal Refai-Ahmed; Hoa Do; I-Ru Chen; Jae-Gyung Ahn; Huayan Wang; Xin Wu; Suresh Ramalingam (CCECE, 2021)

Product Lifetime Estimation in 7nm with Large data of Failure Rate and Si-Based Thermal Coupling Model. - Jae-Gyung Ahn; Rhesa Nathanael; I-Ru Chen; Ping-Chin Yeh; Jonathan Chang (IRPS, 2021)

Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation. - Jae-Gyung Ahn; Jim Wesselkamper; Ryan S. W. Baek; Ping-Chin Yeh; Jonathan Chang; Jennifer Wong; Xin Wu (IRPS, 2022)

Estimation of Product Lifetime with Highly Varying Die Temperature. - Jae-Gyung Ahn; Md Malekkul Islam; Gamal Refai-Ahmed; Bhoomika Devaru Hedge; Guan-Yu Lin; Po-Chiao Chang; Ping-Chin Yeh; Jonathan Chang (IRPS, 2025)