Analysis and prevention of DRAM latch-up during power-on. - Young-Hee Kim; Jae-Yoon Sim; Hong June Park; Jae-Ik Doh; Kun-Woo Park; Hyun-Woong Chung; Jong-Hoon Oh; Choon-Sik Oh; Seung-Han Ahn (IEEE J. Solid State Circuits, 1997)