Reconstruction of Surface Spectral Reflectances Using Characteristic Vectors of Munsell Colors. - Jae Kwon Eem; Hyun Duk Shin; Seung-ok Park (CIC, 1994)

Development of Spectral Sensitivity Measurement System of Image Sensor Devices. - Seung-ok Park; Hongsuk Kim; Jung Man Park; Jae Kwon Eem (CIC, 1995)