A Novel 3D Gate-All-Around Vertical FeFET with Back-Gate Structure for Disturbance-Less Program Operation. - Boncheol Ku; Jae-Min Sim; Jae Seok Hur; Jae Kyeong Jeong; Yun-Heub Song; Changhwan Choi (IMW, 2024)

A String-Select-Line Separation Patterning Scheme for Low Voltage and High-Speed Program Operation in 3D NAND Flash Memory With Separated Source-Line. - Jae-Min Sim; Hakyeong Kim; Yun-Heub Song (IEEE Access, 2024)